Gabriel A. G. Andrade, Marleson Graf, Nícolas Pfeifer, Luiz C. V. dos Santos. Steep coverage-ascent directed test generation for shared-memory verification of multicore chips. In Iris Bahar, editor, Proceedings of the International Conference on Computer-Aided Design, ICCAD 2018, San Diego, CA, USA, November 05-08, 2018. pages 29, ACM, 2018. [doi]
Abstract is missing.