Simone Anedda, Paolo Bernardi 0002, Matteo Coppetta, Giorgio Insinga, Tommaso Montedoro, Annachiara Ruospo, Rudolf Ullmann, Felix Tengler. Off-Chip Super-Resolution AI Model to Support Embedded Memory Diagnosis. In IEEE European Test Symposium, ETS 2026, Chania, Greece, May 25-29, 2026. pages 1-6, IEEE, 2026. [doi]
Abstract is missing.