Self-Test Library Generation for In-Field Test of Path Delay Faults - researchr publication authors

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Lorena Anghel, Riccardo Cantoro, Riccardo Masante, Michele Portolan, Sandro Sartoni, Matteo Sonza Reorda. Self-Test Library Generation for In-Field Test of Path Delay Faults. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(11):4246-4259, November 2023. [doi]

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