Lorena Anghel, Riccardo Cantoro, Riccardo Masante, Michele Portolan, Sandro Sartoni, Matteo Sonza Reorda. Self-Test Library Generation for In-Field Test of Path Delay Faults. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(11):4246-4259, November 2023. [doi]
@article{AnghelCMPSR23,
title = {Self-Test Library Generation for In-Field Test of Path Delay Faults},
author = {Lorena Anghel and Riccardo Cantoro and Riccardo Masante and Michele Portolan and Sandro Sartoni and Matteo Sonza Reorda},
year = {2023},
month = {November},
doi = {10.1109/TCAD.2023.3268210},
url = {https://doi.org/10.1109/TCAD.2023.3268210},
researchr = {https://researchr.org/publication/AnghelCMPSR23},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {42},
number = {11},
pages = {4246-4259},
}