Lorena Anghel, Régis Leveugle, Pierre Vanhauwaert. Evaluation of SET and SEU Effects at Multiple Abstraction Levels. In 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 6-8 July 2005, Saint Raphael, France. pages 309-312, IEEE Computer Society, 2005. [doi]
@inproceedings{AnghelLV05,
title = {Evaluation of SET and SEU Effects at Multiple Abstraction Levels},
author = {Lorena Anghel and Régis Leveugle and Pierre Vanhauwaert},
year = {2005},
doi = {10.1109/IOLTS.2005.28},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.28},
tags = {abstraction},
researchr = {https://researchr.org/publication/AnghelLV05},
cites = {0},
citedby = {0},
pages = {309-312},
booktitle = {11th IEEE International On-Line Testing Symposium (IOLTS 2005), 6-8 July 2005, Saint Raphael, France},
publisher = {IEEE Computer Society},
isbn = {0-7695-2406-0},
}