Lorena Anghel, Ernesto Sánchez, Matteo Sonza Reorda, Giovanni Squillero, Raoul Velazco. Coupling Different Methodologies to Validate Obsolete Microprocessors. In 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. pages 250-255, IEEE Computer Society, 2004. [doi]
Abstract is missing.