Md Toufiq Hasan Anik, Mohammad Ebrahimabadi, Hamed Pirsiavash, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi. On-Chip Voltage and Temperature Digital Sensor for Security, Reliability, and Portability. In 38th IEEE International Conference on Computer Design, ICCD 2020, Hartford, CT, USA, October 18-21, 2020. pages 506-509, IEEE, 2020. [doi]
Abstract is missing.