Ehab Anis, Nicola Nicolici. Interactive presentation: Low cost debug architecture using lossy compression for silicon debug. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 225-230, ACM, 2007. [doi]
Abstract is missing.