V. Anjos, M. J. V. Bell, Elder A. de Vasconcelos, E. F. da Silva, A. A. Andrade, R. W. A. Franco, M. P. P. Castro, I. A. Esquef, R. T. Faria. Thermal-lens and photo-acoustic methods for the determination of SiC thermal properties. Microelectronics Journal, 36(11):977-980, 2005. [doi]
Abstract is missing.