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5.5 V tolerant I/O in a 2.5 V 0.25 μm CMOS technology

Anne-Johan Annema, Govert Geelen, Peter C. de Jong. 5.5 V tolerant I/O in a 2.5 V 0.25 μm CMOS technology. In Proceedings of the IEEE 2000 Custom Integrated Circuits Conference, CICC 2000, Orlando, FL, USA, May 21-24, 2000. pages 417-420, IEEE, 2000. [doi]

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