Time-Multiplexed 1687-Network for Test Cost Reduction

Muhammad Adil Ansari, Jihun Jung, Dooyoung Kim, Sungju Park. Time-Multiplexed 1687-Network for Test Cost Reduction. IEEE Trans. on CAD of Integrated Circuits and Systems, 37(8):1681-1691, 2018. [doi]

Abstract

Abstract is missing.