Sadok Aouini, Kun Chuai, Gordon W. Roberts. A low-cost ATE phase signal generation technique for test applications. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 29-38, IEEE, 2010. [doi]
Abstract is missing.