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System-Level Test: State of the Art and Challenges

Davide Appello, H. H. Chen, Matthias Sauer 0002, Ilia Polian, Paolo Bernardi, Matteo Sonza Reorda. System-Level Test: State of the Art and Challenges. In 27th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2021, Torino, Italy, June 28-30, 2021. pages 1-7, IEEE, 2021. [doi]

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Davide Appello

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H. H. Chen

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Matthias Sauer 0002

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Ilia Polian

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Paolo Bernardi

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Matteo Sonza Reorda

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