System-Level Test: State of the Art and Challenges

Davide Appello, H. H. Chen, Matthias Sauer 0002, Ilia Polian, Paolo Bernardi, Matteo Sonza Reorda. System-Level Test: State of the Art and Challenges. In 27th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2021, Torino, Italy, June 28-30, 2021. pages 1-7, IEEE, 2021. [doi]

@inproceedings{AppelloC0PBR21,
  title = {System-Level Test: State of the Art and Challenges},
  author = {Davide Appello and H. H. Chen and Matthias Sauer 0002 and Ilia Polian and Paolo Bernardi and Matteo Sonza Reorda},
  year = {2021},
  doi = {10.1109/IOLTS52814.2021.9486708},
  url = {https://doi.org/10.1109/IOLTS52814.2021.9486708},
  researchr = {https://researchr.org/publication/AppelloC0PBR21},
  cites = {0},
  citedby = {0},
  pages = {1-7},
  booktitle = {27th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2021, Torino, Italy, June 28-30, 2021},
  publisher = {IEEE},
  isbn = {978-1-6654-3370-9},
}