Davide Appello, Fulvio Corno, M. Giovinetto, Maurizio Rebaudengo, Matteo Sonza Reorda. A P1500 Compliant BIST-Based Approach to Embedded RAM Diagnosis. In 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan. pages 97-102, IEEE Computer Society, 2001. [doi]
@inproceedings{AppelloCGRR01,
title = {A P1500 Compliant BIST-Based Approach to Embedded RAM Diagnosis},
author = {Davide Appello and Fulvio Corno and M. Giovinetto and Maurizio Rebaudengo and Matteo Sonza Reorda},
year = {2001},
url = {http://csdl.computer.org/comp/proceedings/ats/2001/1378/00/13780097abs.htm},
tags = {rule-based, systematic-approach},
researchr = {https://researchr.org/publication/AppelloCGRR01},
cites = {0},
citedby = {0},
pages = {97-102},
booktitle = {10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan},
publisher = {IEEE Computer Society},
isbn = {0-7695-1378-6},
}