Davide Appello, Fulvio Corno, M. Giovinetto, Maurizio Rebaudengo, Matteo Sonza Reorda. A P1500 Compliant BIST-Based Approach to Embedded RAM Diagnosis. In 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan. pages 97-102, IEEE Computer Society, 2001. [doi]
Abstract is missing.