Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda. A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. In 10th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2002), 10-12 July 2002, Isle of Bendor, France. pages 12-16, IEEE Computer Society, 2002. [doi]
Abstract is missing.