A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques - researchr publication authors

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Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda. A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. In 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 8-10 July 2002, Isle of Bendor, France. pages 206-210, IEEE Computer Society, 2002. [doi]

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