Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda. A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. In 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 8-10 July 2002, Isle of Bendor, France. pages 206-210, IEEE Computer Society, 2002. [doi]
@inproceedings{AppelloFTCRR02:0,
title = {A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques},
author = {Davide Appello and Alessandra Fudoli and Vincenzo Tancorre and Fulvio Corno and Maurizio Rebaudengo and Matteo Sonza Reorda},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/ioltw/2002/1641/00/16410206abs.htm},
tags = {rule-based},
researchr = {https://researchr.org/publication/AppelloFTCRR02%3A0},
cites = {0},
citedby = {0},
pages = {206-210},
booktitle = {8th IEEE International On-Line Testing Workshop (IOLTW 2002), 8-10 July 2002, Isle of Bendor, France},
publisher = {IEEE Computer Society},
isbn = {0-7695-1641-6},
}