Embedded Memory Diagnosis: An Industrial Workflow

Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda. Embedded Memory Diagnosis: An Industrial Workflow. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-9, IEEE, 2006. [doi]

Abstract

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