Design for testability of embedded integrated operational amplifiers

Karim Arabi, Bozena Kaminska. Design for testability of embedded integrated operational amplifiers. J. Solid-State Circuits, 33(4):573-581, 1998. [doi]

@article{ArabiK98-0,
  title = {Design for testability of embedded integrated operational amplifiers},
  author = {Karim Arabi and Bozena Kaminska},
  year = {1998},
  doi = {10.1109/4.663562},
  url = {https://doi.org/10.1109/4.663562},
  researchr = {https://researchr.org/publication/ArabiK98-0},
  cites = {0},
  citedby = {0},
  journal = {J. Solid-State Circuits},
  volume = {33},
  number = {4},
  pages = {573-581},
}