Masayuki Arai, Tatsuro Endo, Kazuhiko Iwasaki, Michinobu Nakao, Iwao Suzuki. Reduction of Area per Good Die for SoC Memory Built-In Self-Test. IEICE Transactions, 93-A(12):2463-2471, 2010. [doi]
@article{AraiEINS10,
title = {Reduction of Area per Good Die for SoC Memory Built-In Self-Test},
author = {Masayuki Arai and Tatsuro Endo and Kazuhiko Iwasaki and Michinobu Nakao and Iwao Suzuki},
year = {2010},
url = {http://search.ieice.org/bin/summary.php?id=e93-a_12_2463},
tags = {testing},
researchr = {https://researchr.org/publication/AraiEINS10},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {93-A},
number = {12},
pages = {2463-2471},
}