Reduction of Area per Good Die for SoC Memory Built-In Self-Test

Masayuki Arai, Tatsuro Endo, Kazuhiko Iwasaki, Michinobu Nakao, Iwao Suzuki. Reduction of Area per Good Die for SoC Memory Built-In Self-Test. IEICE Transactions, 93-A(12):2463-2471, 2010. [doi]

Abstract

Abstract is missing.