Masayuki Arai, Akifumi Suto, Kazuhiko Iwasaki, Katsuyuki Nakano, Michihiro Shintani, Kazumi Hatayama, Takashi Aikyo. Small Delay Fault Model for Intra-Gate Resistive Open Defects. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 27-32, IEEE Computer Society, 2009. [doi]
Abstract is missing.