A reconfigurable scan network based IC identification for embedded devices

Omid Aramoon, Xi Chen, Gang Qu. A reconfigurable scan network based IC identification for embedded devices. In 2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018. pages 479-484, IEEE, 2018. [doi]

Authors

Omid Aramoon

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Xi Chen

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Gang Qu

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