Omid Aramoon, Xi Chen, Gang Qu. A reconfigurable scan network based IC identification for embedded devices. In 2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018. pages 479-484, IEEE, 2018. [doi]
@inproceedings{AramoonCQ18,
title = {A reconfigurable scan network based IC identification for embedded devices},
author = {Omid Aramoon and Xi Chen and Gang Qu},
year = {2018},
doi = {10.23919/DATE.2018.8342056},
url = {https://doi.org/10.23919/DATE.2018.8342056},
researchr = {https://researchr.org/publication/AramoonCQ18},
cites = {0},
citedby = {0},
pages = {479-484},
booktitle = {2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018},
publisher = {IEEE},
isbn = {978-3-9819263-0-9},
}