A design-for-reliability approach based on grading library cells for aging effects

Senthil Arasu, Mehrdad Nourani, John M. Carulli, Kenneth M. Butler, Vijay Reddy. A design-for-reliability approach based on grading library cells for aging effects. In 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013. pages 1-7, IEEE Computer Society, 2013. [doi]

Abstract

Abstract is missing.