Houssam Arbess, Marise Bafleur, David Trémouilles, Moustafa Zerarka. Optimization of a MOS-IGBT-SCR ESD protection component in smart power SOI technology. Microelectronics Reliability, 55(9-10):1476-1480, 2015. [doi]
@article{ArbessBTZ15, title = {Optimization of a MOS-IGBT-SCR ESD protection component in smart power SOI technology}, author = {Houssam Arbess and Marise Bafleur and David Trémouilles and Moustafa Zerarka}, year = {2015}, doi = {10.1016/j.microrel.2015.06.138}, url = {http://dx.doi.org/10.1016/j.microrel.2015.06.138}, researchr = {https://researchr.org/publication/ArbessBTZ15}, cites = {0}, citedby = {0}, journal = {Microelectronics Reliability}, volume = {55}, number = {9-10}, pages = {1476-1480}, }