Optimization of a MOS-IGBT-SCR ESD protection component in smart power SOI technology

Houssam Arbess, Marise Bafleur, David Trémouilles, Moustafa Zerarka. Optimization of a MOS-IGBT-SCR ESD protection component in smart power SOI technology. Microelectronics Reliability, 55(9-10):1476-1480, 2015. [doi]

Abstract

Abstract is missing.