Stefano Aresu, Ward De Ceuninck, G. Van den bosch, Guido Groeseneken, Peter Moens, Jean Manca, D. Wojciechowski, P. Gassot. Evidence for source side injection hot carrier effects on lateral DMOS transistors. Microelectronics Reliability, 44(9-11):1621-1624, 2004. [doi]
@article{AresuCbGMMWG04,
title = {Evidence for source side injection hot carrier effects on lateral DMOS transistors},
author = {Stefano Aresu and Ward De Ceuninck and G. Van den bosch and Guido Groeseneken and Peter Moens and Jean Manca and D. Wojciechowski and P. Gassot},
year = {2004},
doi = {10.1016/j.microrel.2004.07.080},
url = {http://dx.doi.org/10.1016/j.microrel.2004.07.080},
researchr = {https://researchr.org/publication/AresuCbGMMWG04},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {44},
number = {9-11},
pages = {1621-1624},
}