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Evidence for source side injection hot carrier effects on lateral DMOS transistors

Stefano Aresu, Ward De Ceuninck, G. Van den bosch, Guido Groeseneken, Peter Moens, Jean Manca, D. Wojciechowski, P. Gassot. Evidence for source side injection hot carrier effects on lateral DMOS transistors. Microelectronics Reliability, 44(9-11):1621-1624, 2004. [doi]

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