Evidence for source side injection hot carrier effects on lateral DMOS transistors - researchr publication related

researchr

You are not signed in
Sign in
Sign up

Stefano Aresu, Ward De Ceuninck, G. Van den bosch, Guido Groeseneken, Peter Moens, Jean Manca, D. Wojciechowski, P. Gassot. Evidence for source side injection hot carrier effects on lateral DMOS transistors. Microelectronics Reliability, 44(9-11):1621-1624, 2004. [doi]

The following publications are possibly variants of this publication:

Reliability assessment of integrated power transistors: Lateral DMOS versus vertical DMOSP. Moens, G. Van den bosch. mr, 48(8-9):1300-1305, 2008. [doi]

Locating hot carrier injection in n-type DeMOS transistors by Charge Pumping and 2D device simulationsFilip Bauwens, Peter Moens. mr, 44(9-11):1625-1629, 2004. [doi]

runs on WebDSL