Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Stefano Aresu, Werner Kanert, Reinhard Pufall, Michael Goroll. Exceptional operative gate voltage induces negative bias temperature instability (NBTI) on n-type trench DMOS transistors. Microelectronics Reliability, 47(9-11):1416-1418, 2007. [doi]