Brian Arkin. Lowering the cost of test with a scalable ATE custom processor and timing IC containing 400 high-linearity timing verniers. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 6, IEEE, 2005. [doi]
@inproceedings{Arkin05, title = {Lowering the cost of test with a scalable ATE custom processor and timing IC containing 400 high-linearity timing verniers}, author = {Brian Arkin}, year = {2005}, doi = {10.1109/TEST.2005.1584052}, url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2005.1584052}, researchr = {https://researchr.org/publication/Arkin05}, cites = {0}, citedby = {0}, pages = {6}, booktitle = {Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005}, publisher = {IEEE}, isbn = {0-7803-9038-5}, }