Fault Dictionary Size Reduction through Test Response Superposition - researchr publication authors

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Baris Arslan, Alex Orailoglu. Fault Dictionary Size Reduction through Test Response Superposition. In 20th International Conference on Computer Design (ICCD 2002), VLSI in Computers and Processors, 16-18 September 2002, Freiburg, Germany, Proceedings. pages 480, IEEE Computer Society, 2002. [doi]

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