Baris Arslan, Alex Orailoglu. Fault Dictionary Size Reduction through Test Response Superposition. In 20th International Conference on Computer Design (ICCD 2002), VLSI in Computers and Processors, 16-18 September 2002, Freiburg, Germany, Proceedings. pages 480, IEEE Computer Society, 2002. [doi]
@inproceedings{ArslanO02,
title = {Fault Dictionary Size Reduction through Test Response Superposition},
author = {Baris Arslan and Alex Orailoglu},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/iccd/2002/1700/00/17000480abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/ArslanO02},
cites = {0},
citedby = {0},
pages = {480},
booktitle = {20th International Conference on Computer Design (ICCD 2002), VLSI in Computers and Processors, 16-18 September 2002, Freiburg, Germany, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-7695-1700-5},
}