Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman. Full Open Defects in Nanometric CMOS. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 119-124, IEEE Computer Society, 2008. [doi]
Abstract is missing.