Low-Power Scan Testing: A Scan Chain Partitioning and Scan Hold Based Technique

Efi Arvaniti, Yiorgos Tsiatouhas. Low-Power Scan Testing: A Scan Chain Partitioning and Scan Hold Based Technique. J. Electronic Testing, 30(3):329-341, 2014. [doi]

Authors

Efi Arvaniti

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Yiorgos Tsiatouhas

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