Efi Arvaniti, Yiorgos Tsiatouhas. Low-Power Scan Testing: A Scan Chain Partitioning and Scan Hold Based Technique. J. Electronic Testing, 30(3):329-341, 2014. [doi]
@article{ArvanitiT14,
title = {Low-Power Scan Testing: A Scan Chain Partitioning and Scan Hold Based Technique},
author = {Efi Arvaniti and Yiorgos Tsiatouhas},
year = {2014},
doi = {10.1007/s10836-014-5453-9},
url = {http://dx.doi.org/10.1007/s10836-014-5453-9},
researchr = {https://researchr.org/publication/ArvanitiT14},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {30},
number = {3},
pages = {329-341},
}