H-SCAN+: A Practical Low-Overhead RTL Design-for-Testability Technique for Industrial Designs - researchr publication

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Toshiharu Asaka, Masaaki Yoshida, Subhrajit Bhattacharya, Sujit Dey. H-SCAN+: A Practical Low-Overhead RTL Design-for-Testability Technique for Industrial Designs. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 265-274, IEEE Computer Society, 1997.

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