Peter M. Asbeck, Sravya Alluri, Narek Rostomyan, Jefy Alex Jayamon. Reliability of CMOS-SOI power amplifiers for millimeter-wave 5G: the case for pMOS (Invited). In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 4, IEEE, 2022. [doi]
Abstract is missing.