ICMAT 2011 - Reliability and variability of semiconductor devices and ICs

Asen Asenov, Ulf Schlichtmann, Cher Ming Tan, Hei Wong, Xing Zhou. ICMAT 2011 - Reliability and variability of semiconductor devices and ICs. Microelectronics Reliability, 52(8):1531, 2012. [doi]

Abstract

Abstract is missing.