A Single-Event Transient (SET) Tolerant Dynamic Bias Comparator in 65-nm CMOS - researchr publication

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Andrew Ash, John Hu. A Single-Event Transient (SET) Tolerant Dynamic Bias Comparator in 65-nm CMOS. In 66th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2023, Tempe, AZ, USA, August 6-9, 2023. pages 167-171, IEEE, 2023. [doi]

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