Maryam Ashouei, Abhijit Chatterjee, Adit D. Singh. Post-Manufacture Tuning for Nano-CMOS Yield Recovery Using Reconfigurable Logic. IEEE Trans. VLSI Syst., 18(4):675-679, 2010. [doi]
@article{AshoueiCS10,
title = {Post-Manufacture Tuning for Nano-CMOS Yield Recovery Using Reconfigurable Logic},
author = {Maryam Ashouei and Abhijit Chatterjee and Adit D. Singh},
year = {2010},
doi = {10.1109/TVLSI.2009.2014559},
url = {http://dx.doi.org/10.1109/TVLSI.2009.2014559},
tags = {logic},
researchr = {https://researchr.org/publication/AshoueiCS10},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {18},
number = {4},
pages = {675-679},
}