Post-Manufacture Tuning for Nano-CMOS Yield Recovery Using Reconfigurable Logic

Maryam Ashouei, Abhijit Chatterjee, Adit D. Singh. Post-Manufacture Tuning for Nano-CMOS Yield Recovery Using Reconfigurable Logic. IEEE Trans. VLSI Syst., 18(4):675-679, 2010. [doi]

Abstract

Abstract is missing.