An on-chip NBTI monitor for estimating analog circuit degradation

Syed Askari, Mehrdad Nourani, Mini Rawat. An on-chip NBTI monitor for estimating analog circuit degradation. In 30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012. pages 68-73, IEEE, 2012. [doi]

Abstract

Abstract is missing.