Yunus Emre Aslan, Florian Cacho, T. Kumar, D. K. Janardan, A. Kumar, F. Giner, M. Faurichon, Lorena Anghel. Minimum SRAM Retention Voltage: Insight about optimizing Power Efficiency across Temperature Profile, Process Variation and Aging. In Alessandro Savino, Michail Maniatakos, Stefano Di Carlo, Dimitris Gizopoulos, editors, 29th International Symposium on On-Line Testing and Robust System Design, IOLTS 2023, Crete, Greece, July 3-5, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.