Table of Contents

• Feedback-Tuned Fuzzing for Accelerating Quality Verification of Approximate Computing DesignYusei Honda, Yutaka Masuda, Tohru Ishihara. 1-3 [doi]
• A Study of High Temperature Effects on Ring Oscillator Based Physical Unclonable FunctionsAghiles Douadi, Giorgio Di Natale, Paolo Maistri, Elena Ioana Vatajelu, Vincent Beroulle. 1-7 [doi]
• $\text{MP}\ell\circ \mathrm{C}$: Privacy-Preserving IP Verification Using Logic Locking and Secure Multiparty ComputationDimitris Mouris, Charles Gouert, Nektarios Georgios Tsoutsos. 1-8 [doi]
• An Integrated Testbed for Trojans in Printed Circuit Boards with Fuzzing CapabilitiesPrashanth Krishnamurthy, Hammond Pearce, Virinchi Roy Surabhi, Joshua Trujillo, Ramesh Karri, Farshad Khorrami. 1-4 [doi]
• About the Correlation between Logical Identified Faulty Gates and their Layout CharacteristicsPaolo Bernardi, Lorenzo Cardone, Giusy Iaria, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre. 1-7 [doi]
• SLM ISA and Hardware Extensions for RISC-V ProcessorsSeyedeh Maryam Ghasemi, Sergej Meschkov, Jonas Krautter, Dennis R. E. Gnad, Mehdi B. Tahoori. 1-5 [doi]
• Minimum SRAM Retention Voltage: Insight about optimizing Power Efficiency across Temperature Profile, Process Variation and AgingYunus Emre Aslan, Florian Cacho, T. Kumar, D. K. Janardan, A. Kumar, F. Giner, M. Faurichon, Lorena Anghel. 1-6 [doi]
• Detecting Hardware Faults in Approximate Adders via Minimum RedundancyIoannis Tsounis, Dimitris Agiakatsikas, Mihalis Psarakis. 1-7 [doi]
• ERrOR: Improving Performance and Fault Tolerance Using Early ExecutionRaj Kumar Choudhary, Janeel Patel, Virendra Singh. 1-3 [doi]
• Space Shuttle: A Test Vehicle for the Reliability of the SkyWater 130nm PDK for Future Space ProcessorsIvan Rodriguez-Ferrandez, Leonidas Kosmidis, Maris Tali, David Steenari. 1-3 [doi]
• Exploiting the Error Resilience of the Preconditioned Conjugate Gradient Method for Energy and Delay OptimizationNatalia Lylina, Stefan Holst, Hanieh Jafarzadeh, Alexandra Kourfali, Hans-Joachim Wunderlich. 1-7 [doi]
• Artificial Neural Network Accelerator for Classification of In-Field Conducted Noise in Integrated Circuits' DC Power LinesFabian Vargas 0001, Douglas Borba, Juliano Benfica, Rizwan Tariq Syed. 1-6 [doi]
• Radiation-Induced Errors in the Software Level of Real-Time Soft Processing SystemCorrado De Sio, Daniele Rizzieri, Andrea Portaluri, Salvatore Gabriele La Greca, Sarah Azimi. 1-3 [doi]
• Neural Network Quantisation for Faster Homomorphic EncryptionWouter Legiest, Furkan Turan, Michiel Van Beirendonck, Jan-Pieter D'Anvers, Ingrid Verbauwhede. 1-3 [doi]
• Towards Dependable RISC-V Cores for Edge Computing DevicesPegdwende Romaric Nikiema, Alessandro Palumbo, Allan Aasma, Luca Cassano, Angeliki Kritikakou, Ari Kulmala, Jari Lukkarila, Marco Ottavi, Rafail Psiakis, Marcello Traiola. 1-7 [doi]
• A Novel Approach to Error Resilience in Online Reinforcement LearningChandramouli N. Amarnath, Abhijit Chatterjee. 1-7 [doi]
• Evaluation and Mitigation of Faults Affecting Swin TransformersGabriele Gavarini, Annachiara Ruospo, Ernesto Sánchez 0001. 1-7 [doi]
• ML-Based Online Design Error Localization for RISC-V ImplementationsHardi Selg, Maksim Jenihhin, Peeter Ellervee, Jaan Raik. 1-7 [doi]
• Microarchitecture-Aware Timing Error Prediction via Deep Neural NetworksStyliani Tompazi, Georgios Karakonstantis. 1-8 [doi]
• On-Chip SRAM Disclosure Attack Prevention Technique for SoCProkash Ghosh, Yogesh Gholap, Virendra Singh. 1-7 [doi]
• ShapeShifter: Protecting FPGAs from Side-Channel Attacks with Isofunctional Heterogeneous ModulesMahya Morid Ahmadi, Lilas Alrahis, Ozgur Sinanoglu, Muhammad Shafique 0001. 1-7 [doi]
• Silent Data Corruptions: The Stealthy Saboteurs of Digital IntegrityGeorge Papadimitriou 0001, Dimitris Gizopoulos, Harish Dattatraya Dixit, Sriram Sankar. 1-7 [doi]
• On Evaluating the Security of Dynamic Scan Obfuscation SchemeGaurav Kumar, Anjum Riaz, Yamuna Prasad, Satyadev Ahlawat. 1-7 [doi]
• TREFU: An Online Error Detecting and Correcting Fault Tolerant GPGPU ArchitectureRaghunandana K. K, B. K. S. V. L. Varaprasad, Matteo Sonza Reorda, Virendra Singh. 1-7 [doi]
• Ray-Spect: Local Parametric Degradation for Secure Designs: An application to X-Ray Fault InjectionNasr-Eddine Ouldei Tebina, Laurent Maingault, Nacer-Eddine Zergainoh, Guillaume Hubert, Paolo Maistri. 1-7 [doi]
• On the Facilitation of Voltage Over-Scaling and Minimization of Timing Errors in Floating-Point MultipliersGeorgios Chatzitsompanis, Georgios Karakonstantis. 1-7 [doi]
• On the Development of Prognostics and System Health Management (PHM) Techniques for ReRAM ApplicationsJose Cayo, Matias Melivilu, Antonio Rubio 0001, Ioannis Vourkas. 1-4 [doi]
• Experimental Evaluation of Delayed-Based Detectors Against Power-off AttackMaryam Esmaeilian, Aghiles Douadi, Zahra Kazemi, Vincent Beroulle, Amir-Pasha Mirbaha, Mahdi Fazeli, Elena Ioana Vatajelu, Paolo Maistri, Giorgio Di Natale. 1-3 [doi]
• A Learning-Based Approach for Single Event Transient Analysis in Pass Transistor LogicZ. Zhang, Zhihang Wu, Christian Weis, Norbert Wehn, Mehdi Baradaran Tahoori. 1-7 [doi]
• Keytone: Silent Data Corruptions at ScaleHarish Dixit. 1-2 [doi]
• Radiation Hardness Evaluations of a Stacked Flip Flop in a 22 nm FD-SOI Process by Heavy-Ion IrradiationShotaro Sugitani, Ryuichi Nakajima, Takafumi Ito, Jun Furuta, Kazutoshi Kobayashi, Mathieu Louvat, Francois Jacquet, Jean-Christophe Eloy, Olivier Montfort, Lionel Jure, Vincent Huard. 1-5 [doi]
• Avoiding Soft Error-Induced Illegal Memory Accesses in GPU with Inter-Thread CommunicationRiku Iwamoto, Masanori Hashimoto. 1-7 [doi]
• On-Line Method to Limit Unreliability and Bit-Aliasing in RO-PUFSergio Vinagrero Gutierrez, Giorgio Di Natale, Elena Ioana Vatajelu. 1-6 [doi]
• BALoo: First and Efficient Countermeasure Dedicated to Persistent Fault AttacksPierre-Antoine Tissot, Lilian Bossuet, Vincent Grosso. 1-7 [doi]
• SafeLS: An Open Source Implementation of a Lockstep NOEL-V RISC-V CoreMarcel Sarraseca, Sergi Alcaide, Francisco Fuentes, Juan Carlos Rodriguez, Feng Chang, Ilham Lasfar, Ramon Canal, Francisco J. Cazorla, Jaume Abella 0001. 1-7 [doi]