Shotaro Sugitani, Ryuichi Nakajima, Takafumi Ito, Jun Furuta, Kazutoshi Kobayashi, Mathieu Louvat, Francois Jacquet, Jean-Christophe Eloy, Olivier Montfort, Lionel Jure, Vincent Huard. Radiation Hardness Evaluations of a Stacked Flip Flop in a 22 nm FD-SOI Process by Heavy-Ion Irradiation. In Alessandro Savino, Michail Maniatakos, Stefano Di Carlo, Dimitris Gizopoulos, editors, 29th International Symposium on On-Line Testing and Robust System Design, IOLTS 2023, Crete, Greece, July 3-5, 2023. pages 1-5, IEEE, 2023. [doi]
Abstract is missing.