Shotaro Sugitani - researchr alias

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Viewing Publication 1 - 4 from 4

2023

Frequency Dependency of Soft Error Rates Based on Dynamic Soft Error MeasurementsHaruto Sugisaki, Ryuichi Nakajima, Shotaro Sugitani, Jun Furuta, Kazutoshi Kobayashi. icicdt 2023: 68-71 [doi]

Radiation Hardness Evaluations of a Stacked Flip Flop in a 22 nm FD-SOI Process by Heavy-Ion IrradiationShotaro Sugitani, Ryuichi Nakajima, Takafumi Ito, Jun Furuta, Kazutoshi Kobayashi, Mathieu Louvat, Francois Jacquet, Jean-Christophe Eloy, Olivier Montfort, Lionel Jure, Vincent Huard. iolts 2023: 1-5 [doi]

Radiation Hardened Flip-Flops with low Area, Delay and Power Overheads in a 65 nm bulk processShotaro Sugitani, Ryuichi Nakajima, Keita Yoshida, Jun Furuta, Kazutoshi Kobayashi. irps 2023: 1-5 [doi]

SEU Sensitivity of PMOS and NMOS Transistors in a 65 nm Bulk Process by α-Particle IrradiationKeita Yoshida, Ryuichi Nakajima, Shotaro Sugitani, Takafumi Ito, Jun Furuta, Kazutoshi Kobayashi. icicdt 2023: 72-75 [doi]

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